Our Products
Advanced optical measurement and analysis systems designed for precision, reliability, and ease of use in demanding applications.
DeflectionAnalyzer
The DeflectionAnalyzer measures and evaluates the angular change of a light beam during transmission through optical panes with spatial resolution. This advanced system enables precise characterization of optical components across their entire surface.
- Spatial resolution for comprehensive surface analysis
- High-precision measurement of beam deflection angles
- Real-time data acquisition and analysis
- Automated quality assessment with customizable criteria
Key Applications
- Development and testing of LiDAR protective windows
- Quality control in series production of optical components
- Characterization of automotive glazing and displays
- Research and development of advanced optical materials
LithoLight
The LithoLight exposure and masking system is a compact, high-performance solution for photolithography applications. Available in 4" or 6" versions, it features an LED-based optical head providing collimated and homogeneous illumination.
- LED-based optical head with collimated illumination
- Masking function enabling resolutions down to 500 nm
- Compatible with AZ, Shipley, SU-8, and K-CL series
- Compact design for easy integration into production environments
Key Applications
- Wafer-level photolithography and microfabrication
- MEMS and optical sensor manufacturing
- Photonics and waveguide fabrication
- Research, prototyping, and small-batch production